LM330 Pen Type Leeb Hardness Tester

Model:LM330

Measuring Range:(200-960)HLD

Accuracy:<±6HLD

Data Logger:1000 Groups

Applications:LM330 Pen Type Leeb Hardness Tester can be used in Defecting fields such as Installed Machineary and Permanent Assembly Parts, Mould Cavity, Heavy Workpieces, Pressure Vessels, Turbine and other Equipments and Small test area.

Measurement Video

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YUSHI Pen Type Leeb Hardness Tester LM330


YUSHI LM330 Leeb hardness Tester


pen tpye leeb hardness tester


portable hardness testing equipment


YUSHI Digital Portable Hardness Testers



Portable Leeb Hardness Tester Kit


Pen-Type Leeb Hardness Tester (Standard Type)


Probes for hardness testers


Hardness Testers (Portable) - YUSHI


Display1.77 inch TFT color display
Hardness ScaleHL, HB, HRB, HRC, HV, HS, Strength (σb)
Measuring RangeHLD(200-960) HRC(19.8-68.5)HRB(13.5-100) HB(30-651)HV(80-976) HS(26.4-99.5)σb(375-2639)
Impact DevicesD type impact device (Standard); Interchangeable DL type impact device (Optional)
AccuracyMeasuring Error:<±6HLD (HLD=800), Repeatability:<±6HLD (HLD=800)
Measuring Direction360°
MaterialSteel& Cast Steel, Stainless Steel, GC IRON, NC IRON, Cast Aluminum alloy, Copper-zinc alloy, Copper-tin alloy, Brass, Forged Steel, Alloy Tool Steel
Resolution1HL,1HV,1HB,0.1HRB,0.1HRC,0.1HS
CalibrationAutomatic
LanguageChinese, English, Traditional Chinese, Spanish and Japanese
Power1 AAA Battery
Data Memory1000 groups (each group includes 2-6 testing values and 1 average value)
TransmissionUSB 2.0, Used for charging or data transfer
SoftwareLMView software for transmission, storage and printing
Shut-offAuto off after 3 minutes of inactivity
Temperature-10℃~ +50℃
Net Weight110g with Dtype impact device, 125g with DL type impact device
Standard PackingLM330 Leeb Hardness Tester, Standard Calibration block, Support Ring, Cleaning Brush, Packing Files
Optional AccessoriesHardness Calibration Blocks, Support Ring, DL Connector.




YUSHI LM330 Integrated Portable Leeb Hardness Tester Pen Type Design with D Type impact device w/D Test Block, plus data large storage, data communication

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