Single Element Delay Line Probe

YUSHI Delay Line Ultrasonic Probes

YUSHI single element delay line probe is specially designed for high-precision measurement, and can solve a variety of thickness measurement problems when paired with PM5 Gen2 multi-function ultrasonic thickness gauge.

Features of Ultrasonic Single-Crystal Delay-Line Probes

High Resolution and Sensitivity:

Single-crystal piezoelectric materials ensure high acoustic energy conversion efficiency and signal-to-noise ratio.

Ideal for detecting small defects or measuring thin materials.

Narrow Pulse Width:

Reduce scattering attenuation，enabling precise time-of-flight measurements for improved axial resolution.

Replaceable Delay Line:

The built-in polymer or epoxy delay block separates the crystal from the test surface, enhancing near-surface resolution by reducing blind area.

Delay Line can be purchased separately.

Applications of Single Element Delay Line Probe

Flaw detection: 

Identifies cracks, voids, or inclusions in metals, composites, or welds (e.g., aerospace, automotive).

Thickness gauging: Measures material thickness in pipelines, tanks, or coatings.

Precision Thickness Measurements:

Evaluates thin layers or coatings (e.g., semiconductor wafers, solar panels).

High-Temperature Measurement:

Delay-line design allows limited use in elevated-temperature environments (e.g., hot metal surfaces).

Replaceable high temperature delay block for measuring high temperature workpieces.